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Experimental analysis of the thermal annealing of hard a-C:H filmsPETER, S; GÜNTHER, M; GORDAN, O et al.Diamond and related materials. 2014, Vol 45, pp 43-57, issn 0925-9635, 15 p.Article
CMOS sensor-based palm-sized in-line optical analysis device for microchemistry systemsTOKUDA, T; WAKAMA, N; TERAO, K et al.Electronics letters. 2014, Vol 50, Num 17, pp 1222-1224, issn 0013-5194, 3 p.Article
Confinement in single walled carbon nanotubes investigated by spectroscopic ellipsometryBATTIE, Y; JAMON, D; LAURET, J. S et al.Thin solid films. 2014, Vol 571, pp 395-398, issn 0040-6090, 4 p., 3Conference Paper
In situ study of ligand-receptor interaction by total internal reflection ellipsometryBALEVICIUS, Z; BALEVICIUTE, I; TUMENAS, S et al.Thin solid films. 2014, Vol 571, pp 744-748, issn 0040-6090, 5 p., 3Conference Paper
On the complex refractive index of polymer:fullerene photovoltaic blendsCAMPOY-QUILES, M; MÜLLER, C; GARRIGA, M et al.Thin solid films. 2014, Vol 571, pp 371-376, issn 0040-6090, 6 p., 3Conference Paper
Polarizing properties and structural characteristics of the cuticle of the scarab Beetle Chrysina gloriosaDEL RIO, Lía Fernández; ARWIN, Hans; JÄRRENDAHL, Kenneth et al.Thin solid films. 2014, Vol 571, pp 410-415, issn 0040-6090, 6 p., 3Conference Paper
Spectroscopic ellipsometry — Past, present, and futureASPNES, D. E.Thin solid films. 2014, Vol 571, pp 334-344, issn 0040-6090, 11 p., 3Conference Paper
Surface roughness and optical contact characterization of transparent prisms using frustrated total internal reflection tunneling ellipsometryAZZAM, R. M. A.Thin solid films. 2014, Vol 571, pp 666-668, issn 0040-6090, 3 p., 3Conference Paper
Characterization of textured SnO2:F layers by ellipsometry using glass-side illuminationYAMAGUCHI, Shinji; SUGIMOTO, Yoshio; FUJIWARA, Hiroyuki et al.Thin solid films. 2013, Vol 534, pp 149-154, issn 0040-6090, 6 p.Article
Dynamic characterization of photo-alignment of azo-dye-doped polymer using phase modulated polarimetryCHUANG, Chun-I; LIN, Shiuan-Huei; CHAO, Yu-Faye et al.Optical materials (Amsterdam). 2013, Vol 35, Num 3, pp 366-371, issn 0925-3467, 6 p.Article
Formation of stoichiometric, sub-stoichiometric undoped and hydrogen doped tungsten oxide films, enabled by pulsed introduction of O2 or H2 during hot-wire vapor depositionKOSTIS, I; VOURDAS, N; VASILOPOULOU, M et al.Thin solid films. 2013, Vol 537, pp 124-130, issn 0040-6090, 7 p.Article
Multilayer model for determining the thickness and refractive index of sol―gel coatings via laser ellipsometryLOKE, Vincent L. Y; RIEFLER, Norbert; MEHNER, Andreas et al.Thin solid films. 2013, Vol 531, pp 93-98, issn 0040-6090, 6 p.Article
The effect of gallium implantation on the optical properties of diamondDRAGANSKI, M. A; FINKMAN, E; GIBSON, B. C et al.Diamond and related materials. 2013, Vol 35, pp 47-52, issn 0925-9635, 6 p.Article
Thermal properties of poly(neopentylmethacrylate) thin films deposited via solventless, radical initiated chemical vapor depositionVIJAY JAIN BHARAMAIAH JEEVENDRAKUMAR; ALTEMUS, Bruce A; GILDEA, Adam J et al.Thin solid films. 2013, Vol 542, pp 81-86, issn 0040-6090, 6 p.Article
M―line spectroscopic, spectroscopic ellipsometric and microscopic measurements of optical waveguides fabricated by MeV-energy N+ ion irradiation for telecom applicationsBANYASZ, I; BERNESCHI, S; FRIED, M et al.Thin solid films. 2013, Vol 541, pp 3-8, issn 0040-6090, 6 p.Conference Paper
Transmission optimization of multilayer OLED encapsulation based on spectroscopic ellipsometryTO, C. H; WONG, F. L; LEE, C. S et al.Thin solid films. 2013, Vol 549, pp 22-29, issn 0040-6090, 8 p.Conference Paper
Spatial propagation of coherency matrix in polarization opticsDEVLAMINCK, Vincent.Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2012, Vol 29, Num 7, pp 1247-1251, issn 1084-7529, 5 p.Article
Evaluation of the real-time protein adsorption kinetics on albumin-binding surfaces by dynamic in situ spectroscopic ellipsometryGUHA THAKURTA, Sanjukta; VILJOEN, Hendrik J; SUBRAMANIAN, Anuradha et al.Thin solid films. 2012, Vol 520, Num 6, pp 2200-2207, issn 0040-6090, 8 p.Article
Evolution of silicon nanoclusters and hydrogen in SiNx:H films: Influence of high hydrostatic pressure under annealingVOLODIN, V. A; BUGAEV, K. O; GUTAKOVSKY, A. K et al.Thin solid films. 2012, Vol 520, Num 19, pp 6207-6214, issn 0040-6090, 8 p.Article
On the initial growth of atomic layer deposited TiO2 films on silicon and copper surfacesQIANTAO; OVERHAGE, Kirsten; JURSICH, Gregory et al.Thin solid films. 2012, Vol 520, Num 22, pp 6752-6756, issn 0040-6090, 5 p.Article
Raman micro-spectroscopy as a tool to measure the absorption coefficient and the erosion rate of hydrogenated amorphous carbon films heat-treated under hydrogen bombardmentPARDANAUD, C; AREOU, E; MARTIN, C et al.Diamond and related materials. 2012, Vol 22, pp 92-95, issn 0925-9635, 4 p.Article
Scanning Kelvin Probe Study of (Oxyhydr)oxide Surface of Aluminum AlloyÖZKANAT, Ö; SALGIN, B; ROHWERDER, M et al.Journal of physical chemistry. C. 2012, Vol 116, Num 2, pp 1805-1811, issn 1932-7447, 7 p.Article
Local Site Distribution of Oxygen in Silicon-Rich Oxide Thin Films: A Tool to Investigate Phase SeparationRISTIC, Davor; IVANDA, Mile; RIGHINI, Giancarlo C et al.Journal of physical chemistry. C. 2012, Vol 116, Num 18, pp 10039-10047, issn 1932-7447, 9 p.Article
Optical properties and band gap characterization of high dielectric constant oxidesFURSENKO, O; BAUER, J; LUPINA, G et al.Thin solid films. 2012, Vol 520, Num 14, pp 4532-4535, issn 0040-6090, 4 p.Conference Paper
Spectrally resolving single-shot polarimeterKNITTER, Sebastian; HELLWIG, Tim; KUES, Michael et al.Optics letters. 2011, Vol 36, Num 16, pp 3048-3050, issn 0146-9592, 3 p.Article